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4 Point Probe

The 4-point probe method is a technique used in materials science and electrical engineering to measure the resistivity of thin films and bulk materials. It involves four evenly spaced probes that contact the material surface, forming a square or diamond configuration. By passing a known current through the outer probes and measuring the resulting voltage drop across the inner probes.

Category: Product ID: 24008

Description

The 4-point probe method is a technique used in materials science and electrical engineering to measure the resistivity of thin films and bulk materials. It involves four evenly spaced probes that contact the material surface, forming a square or diamond configuration. By passing a known current through the outer probes and measuring the resulting voltage drop across the inner probes.

The resistivity of the material can be calculated using the formula:

ρ=VI⋅dA\rho = \frac{V}{I} \cdot \frac{d}{A}

where:

  • ρ\rho is the resistivity of the material,
  • VV is the voltage measured between the inner probes,
  • II is the current passing through the outer probes,
  • dd is the distance between the probes,
  • AA is the cross-sectional area of the material under the probes.

This method is particularly useful for characterizing semiconductor materials, thin films, and other conductive materials with known geometries. It provides a non-destructive and precise way to determine resistivity, which is crucial for evaluating the electrical properties of materials used in various electronic devices and components.

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