Description
A spectroscopic ellipsometer is a scientific instrument used to measure the properties of thin films and surfaces. It operates based on the principle of ellipsometry, which analyzes changes in polarized light as it interacts with a material’s surface. Spectroscopic ellipsometers provide detailed information about material thickness, refractive index, and optical constants across a range of wavelengths, making them invaluable in research and manufacturing for characterizing semiconductor films, coatings, and other thin-film materials.
- Wavelength range : 330nm-1000nm, UV and NIR option available on request
- Fast automatic measurement
- Precision measuring film thickness and refractive index
- Measurement and spectral characteristics of the optical constants of the various functional materials analysis
- The ellipsometric parameters accuracy of : ≦0.01for Tan (ψ); ≦0.01 for Cos (Δ)
- Measured directly on a transparent substrate of the thin film deposition without backside scratch or blacken treatment
Reviews
There are no reviews yet.